Please use this identifier to cite or link to this item: https://doi.org/10.1154/1.3624887
Title: Structure of melt-quenched AgIn3Te5
Authors: Rangasami, C.
Malar, P. 
Osipowicz, T. 
Jain, M.K.
Kasiviswanathan, S.
Keywords: AgIn3Te5
Electron diffraction
P-type tetragonal
PIXE
Rietveld refinement
Issue Date: 13-Oct-2011
Citation: Rangasami, C., Malar, P., Osipowicz, T., Jain, M.K., Kasiviswanathan, S. (2011-10-13). Structure of melt-quenched AgIn3Te5. Powder Diffraction 26 (3) : 248-255. ScholarBank@NUS Repository. https://doi.org/10.1154/1.3624887
Abstract: Polycrystalline AgIn3Te5 synthesized by melt-quench technique has been analyzed using proton induced X-ray emission (PIXE), X-ray diffraction (XRD), and selected area electron diffraction. PIXE analysis yielded the content of Ag, In, and Te, respectively, to be 9.76%, 31.18%, and 59.05% by weight. Structure refinement was carried out considering those space groups from I- and P-type tetragonal systems which possess 4̄ symmetry and preserve the anion sublattice arrangement of the chalcopyrite structure (space group: I4̄2d) as well. The results showed that AgIn3Te5 synthesized by melt-quench method crystallizes with P-type tetragonal structure (space group: P4̄2c; unit-cell parameters a = 6.2443(8) and c = 12.5058(4) Å), the presence of which was corroborated by selected area electron diffraction studies. © 2011 International Centre for Diffraction Data.
Source Title: Powder Diffraction
URI: http://scholarbank.nus.edu.sg/handle/10635/98069
ISSN: 08857156
DOI: 10.1154/1.3624887
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