Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.physleta.2004.10.008
Title: Structural imperfection distributions and alpha particle detection properties of CVD diamond film
Authors: Wang, S.G.
Zhang, Q.
Bettiol, A.A. 
Keywords: Alpha particle detector
Charge collection efficiency
Chemical vapor deposited diamond
Defects
Issue Date: 22-Nov-2004
Citation: Wang, S.G., Zhang, Q., Bettiol, A.A. (2004-11-22). Structural imperfection distributions and alpha particle detection properties of CVD diamond film. Physics Letters, Section A: General, Atomic and Solid State Physics 332 (5-6) : 475-480. ScholarBank@NUS Repository. https://doi.org/10.1016/j.physleta.2004.10.008
Abstract: The effects of structural imperfection distributions of chemical vapor deposited (CVD) diamond film on alpha (α) particle detection properties were studied in this Letter. Two types of detectors with coplanar and sandwich structures were fabricated using an identical CVD diamond film. An average charge collection efficiency of 52.5% for the coplanar structure and of 45% for the sandwich structure detectors was obtained, respectively. Scanning electron microscopy, Raman scattering, photoluminescence and ion beam induced charge mapping studies directly demonstrate that the different efficiencies of the two types of detectors mainly result from the different structural imperfection distributions between the final and the initial growth sides of the diamond film. © 2004 Elsevier B.V. All rights reserved.
Source Title: Physics Letters, Section A: General, Atomic and Solid State Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/98057
ISSN: 03759601
DOI: 10.1016/j.physleta.2004.10.008
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