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https://doi.org/10.1063/1.2354446
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dc.title | Role of low temperature rapid thermal annealing in post-laser-annealed p-channel metal-oxide-semiconductor field effect transistor | |
dc.contributor.author | Ong, K.K. | |
dc.contributor.author | Pey, K.L. | |
dc.contributor.author | Lee, P.S. | |
dc.contributor.author | Wee, A.T.S. | |
dc.contributor.author | Wang, X.C. | |
dc.contributor.author | Tung, C.H. | |
dc.contributor.author | Tang, L.J. | |
dc.contributor.author | Chong, Y.F. | |
dc.date.accessioned | 2014-10-16T09:39:53Z | |
dc.date.available | 2014-10-16T09:39:53Z | |
dc.date.issued | 2006 | |
dc.identifier.citation | Ong, K.K., Pey, K.L., Lee, P.S., Wee, A.T.S., Wang, X.C., Tung, C.H., Tang, L.J., Chong, Y.F. (2006). Role of low temperature rapid thermal annealing in post-laser-annealed p-channel metal-oxide-semiconductor field effect transistor. Applied Physics Letters 89 (12) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2354446 | |
dc.identifier.issn | 00036951 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/97835 | |
dc.description.abstract | In this letter, the authors study the importance of a low temperature anneal in the removal of crystalline defects resulting from pulsed laser annealing of preamorphized ultrashallow p+/n junction. Using an additional low thermal budget rapid thermal annealing at 600 °C for 60 s, suppression of junction leakage current of two orders in a single-pulse laser annealing and one order in a ten-pulse laser annealing is achieved through a reduction of the residual crystalline defects that could not be annihilated by laser annealing, p-channel metal-oxide-semiconductor field effect transistors with good electrical characteristics can be obtained using pulsed laser annealing followed by a low thermal budget rapid thermal annealing. © 2006 American Institute of Physics. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.2354446 | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | PHYSICS | |
dc.description.doi | 10.1063/1.2354446 | |
dc.description.sourcetitle | Applied Physics Letters | |
dc.description.volume | 89 | |
dc.description.issue | 12 | |
dc.description.page | - | |
dc.description.coden | APPLA | |
dc.identifier.isiut | 000240680300064 | |
Appears in Collections: | Staff Publications |
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