Please use this identifier to cite or link to this item: https://doi.org/10.1103/PhysRevB.77.115416
Title: Raman spectroscopy of epitaxial graphene on a SiC substrate
Authors: Ni, Z.H.
Chen, W. 
Fan, X.F.
Kuo, J.L.
Yu, T.
Wee, A.T.S. 
Shen, Z.X.
Issue Date: 11-Mar-2008
Source: Ni, Z.H., Chen, W., Fan, X.F., Kuo, J.L., Yu, T., Wee, A.T.S., Shen, Z.X. (2008-03-11). Raman spectroscopy of epitaxial graphene on a SiC substrate. Physical Review B - Condensed Matter and Materials Physics 77 (11) : -. ScholarBank@NUS Repository. https://doi.org/10.1103/PhysRevB.77.115416
Abstract: The fabrication of epitaxial graphene (EG) on SiC substrate by annealing has attracted a lot of interest as it may speed up the application of graphene for future electronic devices. The interaction of EG and the SiC substrate is critical to its electronic and physical properties. In this work, the Raman spectroscopy was used to study the structure of EG and its interaction with SiC substrate. All the Raman bands of EG blueshift from that of bulk graphite and graphene made by micromechanical cleavage, which was attributed to the compressive strain induced by the substrate. A model containing 13×13 honeycomb lattice cells of graphene on carbon nanomesh was constructed to explain the origin of strain. The lattice mismatch between graphene layer and substrate causes the compressive stress of 2.27 GPa on graphene. We also demonstrate that the electronic structures of EG grown on Si- and C-terminated SiC substrates are quite different. Our experimental results shed light on the interaction between graphene and SiC substrate, which are critical to the future applications of EG. © 2008 The American Physical Society.
Source Title: Physical Review B - Condensed Matter and Materials Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/97742
ISSN: 10980121
DOI: 10.1103/PhysRevB.77.115416
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

335
checked on Apr 16, 2018

WEB OF SCIENCETM
Citations

317
checked on Apr 16, 2018

Page view(s)

31
checked on Apr 20, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.