Please use this identifier to cite or link to this item:
|Title:||On the formation of 50 nm diameter free-standing silicon wires produced by ion irradiation|
|Citation:||Song, J., Dang, Z.Y., Azimi, S., Breese, M.B.H., Forneris, J., Vittone, E. (2012). On the formation of 50 nm diameter free-standing silicon wires produced by ion irradiation. ECS Journal of Solid State Science and Technology 1 (2) : P66-P69. ScholarBank@NUS Repository. https://doi.org/10.1149/2.015202jss|
|Abstract:||Ion irradiation in conjunction with electrochemical etching is a promising silicon (Si) machining technique for three-dimensional nanofabrication. We present a study of factors influencing the formation of silicon nanowires fabricated by this technique, such as ion energy, fluence, proximity of adjacent wires, location within an irradiated area and wafer resistivity. A better understanding of these factors in different resistivity wafers has enabled us to produce wire diameters and gaps between adjacent wires of about 50 nm using 50 keV protons.Multilayer silicon nanowire arrays are also achieved, so extending the use of this process for three dimensional nanoscale silicon machining. © 2012 The Electrochemical Society. All rights reserved.|
|Source Title:||ECS Journal of Solid State Science and Technology|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Dec 12, 2018
WEB OF SCIENCETM
checked on Dec 4, 2018
checked on Dec 7, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.