Please use this identifier to cite or link to this item: https://doi.org/10.1002/jrs.1063
Title: Near-field scanning Raman microscopy using apertureless probes
Authors: Sun, W.X. 
Shen, Z.X. 
Keywords: Apertureless probe
Near field
Raman imaging
Raman microscopy
Issue Date: 1-Sep-2003
Citation: Sun, W.X., Shen, Z.X. (2003-09-01). Near-field scanning Raman microscopy using apertureless probes. Journal of Raman Spectroscopy 34 (9) : 668-676. ScholarBank@NUS Repository. https://doi.org/10.1002/jrs.1063
Abstract: We describe an apertureless near-field scanning Raman microscope in reflection geometry developed by integrating a near-field scanning optical microscope and a Raman spectrometer. This set-up offers some unique features that make it applicable to more samples. The fabrication of the metal tips is also explained in detail. Near-field Raman mappings have been realized on real silicon devices for the first time. The results illustrate the capability of our near-field Raman microscope in 2D Raman imaging. The apertureless configuration is a breakthrough to the limitation set by the low optical throughput of metal-coated optical fiber tips, reducing drastically the integration time for Raman spectra. The reflection scattering geometry makes the system applicable to any samples without preparation. Copyright © 2003 John Wiley & Sons, Ltd.
Source Title: Journal of Raman Spectroscopy
URI: http://scholarbank.nus.edu.sg/handle/10635/97302
ISSN: 03770486
DOI: 10.1002/jrs.1063
Appears in Collections:Staff Publications

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