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|Title:||Near-field scanning Raman microscopy using apertureless probes|
|Authors:||Sun, W.X. |
|Citation:||Sun, W.X., Shen, Z.X. (2003-09-01). Near-field scanning Raman microscopy using apertureless probes. Journal of Raman Spectroscopy 34 (9) : 668-676. ScholarBank@NUS Repository. https://doi.org/10.1002/jrs.1063|
|Abstract:||We describe an apertureless near-field scanning Raman microscope in reflection geometry developed by integrating a near-field scanning optical microscope and a Raman spectrometer. This set-up offers some unique features that make it applicable to more samples. The fabrication of the metal tips is also explained in detail. Near-field Raman mappings have been realized on real silicon devices for the first time. The results illustrate the capability of our near-field Raman microscope in 2D Raman imaging. The apertureless configuration is a breakthrough to the limitation set by the low optical throughput of metal-coated optical fiber tips, reducing drastically the integration time for Raman spectra. The reflection scattering geometry makes the system applicable to any samples without preparation. Copyright © 2003 John Wiley & Sons, Ltd.|
|Source Title:||Journal of Raman Spectroscopy|
|Appears in Collections:||Staff Publications|
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