Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0921-4534(99)00214-2
Title: Micro-Raman study of ultra-thin YBa2Cu3O7-δ/YSZ films
Authors: Chen, M.S.
Shen, Z.X. 
Zhou, W.Z.
Xu, S.Y. 
Ong, C.K. 
Issue Date: 1-Apr-1999
Source: Chen, M.S., Shen, Z.X., Zhou, W.Z., Xu, S.Y., Ong, C.K. (1999-04-01). Micro-Raman study of ultra-thin YBa2Cu3O7-δ/YSZ films. Physica C: Superconductivity and its Applications 315 (1) : 117-123. ScholarBank@NUS Repository. https://doi.org/10.1016/S0921-4534(99)00214-2
Abstract: Micro-Raman scattering measurements of ultra-thin YBa2Cu3O7-δ (YBCO) films of various thicknesses, deposited by pulsed laser ablation on the yttrium-stabilized-zirconia (YSZ) (001) substrates, were carried out. The frequency of the O(4)-Ag mode shows a more marked increase with decrease in film thfckness than the O(2,3)-B1g mode does. The main contribution to the intensity of the O(2,3)-B1g mode is shown to be from the c-axis oriented grains and that of the O(4)-Ag mode comes from the a-axis oriented grains. Raman evidence for the formation of the BaZrO3 (BZO) transitional layer at the film interface was found, and the frequency changes of the O(4)-Ag and O(2,3)-B1g modes are explained in terms of lattice mismatch between YBCO and BZO at the interface. The large frequency increase of the O(4)-Ag mode with decreasing film thickness is due to the large mismatch between the Cu(2)-Cu(2) separation and the length of one unit cell of BZO, despite the good match between one unit cell of YBCO and three unit cells of BZO for the a-axis oriented grains.
Source Title: Physica C: Superconductivity and its Applications
URI: http://scholarbank.nus.edu.sg/handle/10635/97205
ISSN: 09214534
DOI: 10.1016/S0921-4534(99)00214-2
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

2
checked on Feb 20, 2018

WEB OF SCIENCETM
Citations

2
checked on Nov 23, 2017

Page view(s)

17
checked on Feb 16, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.