Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0168-583X(98)01034-9
Title: Micro-PIXE and channeling PIXE analysis of Ag-doped YBa2Cu3O7-δ thin films
Authors: Osipowicz, T. 
Xu, X.Y.
Yang, C. 
Zhou, W.Z.
Ong, C.K. 
Watt, F. 
Issue Date: 2-Apr-1999
Citation: Osipowicz, T., Xu, X.Y., Yang, C., Zhou, W.Z., Ong, C.K., Watt, F. (1999-04-02). Micro-PIXE and channeling PIXE analysis of Ag-doped YBa2Cu3O7-δ thin films. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 150 (1-4) : 543-547. ScholarBank@NUS Repository. https://doi.org/10.1016/S0168-583X(98)01034-9
Abstract: Nuclear Microscopy, utilizing a 2 MeV He+ beam for channeling Rutherford Backscattering (RBS) and PIXE analysis, was used to characterise Ag-doped YBa2Cu3O7-δ thin films and measure the lateral distribution of the Ag. The samples were prepared by in situ two-beam pulsed laser deposition in order to investigate the effects of such dopings on critical current densities. Films deposited at temperatures above 650°C form needle-like surface structures with a length of up to 100 μm; these tend to align with in-plane a-b axis. Results for a sample prepared at a substrate temperature of 730°C and a maximum Ag concentration of 5 at.% are discussed. The needle-like structures were found to be rich in Ag and Cu, and the YBa2Cu3O7-δ film contained 0.02 at.% Ag. Broad beam PIXE-channeling results indicate that 19% of the Ag is substitutional.
Source Title: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
URI: http://scholarbank.nus.edu.sg/handle/10635/97202
ISSN: 0168583X
DOI: 10.1016/S0168-583X(98)01034-9
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