Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/97001
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dc.titleIonization cross sections of excitons due to scattering by excitons in semiconducting quantum well structures in the presence of a transverse electric field
dc.contributor.authorKoh, T.S.
dc.contributor.authorFeng, Y.P.
dc.contributor.authorSpector, H.N.
dc.date.accessioned2014-10-16T09:30:08Z
dc.date.available2014-10-16T09:30:08Z
dc.date.issued1997-04
dc.identifier.citationKoh, T.S.,Feng, Y.P.,Spector, H.N. (1997-04). Ionization cross sections of excitons due to scattering by excitons in semiconducting quantum well structures in the presence of a transverse electric field. Journal of Physics and Chemistry of Solids 58 (4) : 533-541. ScholarBank@NUS Repository.
dc.identifier.issn00223697
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/97001
dc.description.abstractWe have performed theoretical calculations on the ionization cross-sections of excitons due to scattering by excitons in semiconducting quantum well structures in the presence of an applied transverse electric field. It was found that for the range of incident energies higher than the binding energy of the excitons, the exciton-exciton ionization cross-sections become increasingly important relative to that due to free carrier-exciton scattering as the electric field increases. Quasi three-dimensional features in the ionization cross-sections exhibited by the excitons in the very narrow wells are found to be rather insensitive to changes in electric field strength. © 1997 Elsevier Science Ltd. All rights reserved.
dc.sourceScopus
dc.subjectA. quantum wells
dc.subjectA. semiconductors
dc.subjectD. electrical properties
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.sourcetitleJournal of Physics and Chemistry of Solids
dc.description.volume58
dc.description.issue4
dc.description.page533-541
dc.description.codenJPCSA
dc.identifier.isiutNOT_IN_WOS
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