Please use this identifier to cite or link to this item:
Title: Integration of nano-scale components and supports in micromachined 3D silicon structures
Authors: Song, J.
Azimi, S.
Dang, Z.Y.
Breese, M.B.H. 
Keywords: 3D nano-scale silicon machining
electrochemical anodization
free-standing membranes
ion irradiation
silicon nanostencils
Issue Date: 2014
Citation: Song, J., Azimi, S., Dang, Z.Y., Breese, M.B.H. (2014). Integration of nano-scale components and supports in micromachined 3D silicon structures. Journal of Micromechanics and Microengineering 24 (4) : -. ScholarBank@NUS Repository.
Abstract: We have developed a process for the three-dimensional (3D) machining of p-type silicon on a micro- and nano-scale using high-energy ion beam irradiation with one or more energies and fluences, followed by electrochemical anodization in hydrofluoric acid. We present a study of the dependence of our fabricated structures on irradiating ion energies, fluences, geometries and wafer resistivity. All these factors determine whether the micro- and nano-scale features are properly connected to the supports in the 3D silicon structures. If wrongly chosen, any of these factors may cause a breakage at the connection through localized over-etching. Under optimum irradiation and anodization conditions, free-standing patterned membranes can be fabricated with feature dimensions of 100 nm over areas of many square millimeters. This investigation is based on silicon structures but is relevant to any electro-assisted etching process for 3D fabrication, paving the way for achieving free-standing silicon photonics, mechanical resonators and micro-/nano-electromechanical systems. © 2014 IOP Publishing Ltd.
Source Title: Journal of Micromechanics and Microengineering
ISSN: 13616439
DOI: 10.1088/0960-1317/24/4/045008
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.


checked on Dec 12, 2018


checked on Dec 12, 2018

Page view(s)

checked on Dec 14, 2018

Google ScholarTM



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.