Please use this identifier to cite or link to this item: https://doi.org/10.1103/PhysRevLett.103.067011
Title: Imaging of order parameter induced π phase shifts in cuprate superconductors by low-temperature scanning electron microscopy
Authors: Gürlich, C.
Goldobin, E.
Straub, R.
Doenitz, D.
Ariando 
Smilde, H.-J.H.
Hilgenkamp, H.
Kleiner, R.
Koelle, D.
Issue Date: 7-Aug-2009
Citation: Gürlich, C., Goldobin, E., Straub, R., Doenitz, D., Ariando, Smilde, H.-J.H., Hilgenkamp, H., Kleiner, R., Koelle, D. (2009-08-07). Imaging of order parameter induced π phase shifts in cuprate superconductors by low-temperature scanning electron microscopy. Physical Review Letters 103 (6) : -. ScholarBank@NUS Repository. https://doi.org/10.1103/PhysRevLett.103.067011
Abstract: Low-temperature scanning electron microscopy (LTSEM) has been used to image the supercurrent distribution in ramp-type Josephson junctions between Nb and either the electron-doped cuprate Nd2-xCexCuO4-y or the hole-doped cuprate YBa2Cu3O7. For zigzag-shaped devices in the short junction limit the critical current is strongly suppressed at zero applied magnetic field. The LTSEM images show that this is due to the Josephson current counterflow in neighboring 0 and π facets, which is induced by the dx2-y2 order parameter in the cuprates. Thus, LTSEM provides imaging of the sign change of the superconducting order parameter, which can also be applied to other types of Josephson junctions. © 2009 The American Physical Society.
Source Title: Physical Review Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/96866
ISSN: 00319007
DOI: 10.1103/PhysRevLett.103.067011
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