Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/96395
Title: Electrical and structural characterization of the xCuO:(1-x)V2O5
Authors: Gopalakrishnan, R. 
Chowdari, B.V.R. 
Tan, K.L. 
Issue Date: Jul-1992
Source: Gopalakrishnan, R.,Chowdari, B.V.R.,Tan, K.L. (1992-07). Electrical and structural characterization of the xCuO:(1-x)V2O5. Solid State Ionics 53-56 (PART 2) : 1168-1171. ScholarBank@NUS Repository.
Abstract: Semi-conducting glasses in the binary system xCuO:(1-x)V2Oin5 have been synthesized using the twin-roller quenching technique. The electronic conductivity (σ) of these glasses has been determined in the 295-473 K range to give a simple Arrhenius relationship. The σ has been observed to increase to a maximum value of 3.47×10-5 Ω-1 cm-1 at T=295 K with an activation energy Eact=0.38 eV for the sample with x=0.4 as the CuO content is systematically varied. The interatomic distance of vanadium atoms, calculated from density measurements, and Eact have been found to have an inverse relationship with σ. X-ray photoelectron spectroscopy (XPS) and X-ray excited Auger electron spectroscopy (XAES) investigations show that vanadium ions are present in reduced oxidation states. The proportion of vanadium ions with oxidation state 4 increases with an increase in CuO content. The electrical behavior of these glasses has been discussed in relation to the XPS and XAES data. © 1992.
Source Title: Solid State Ionics
URI: http://scholarbank.nus.edu.sg/handle/10635/96395
ISSN: 01672738
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

45
checked on Feb 18, 2018

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.