Please use this identifier to cite or link to this item:
|Title:||Electric field-induced carbon nanotube junction formation|
|Authors:||Ho, G.W. |
|Citation:||Ho, G.W., Wee, A.T.S., Lin, J. (2001-07-09). Electric field-induced carbon nanotube junction formation. Applied Physics Letters 79 (2) : 260-262. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1383279|
|Abstract:||We present experimental evidence of nanojunction structures explicitly observed after application of high electric fields on multiwall carbon nanotube arrays. The electric field as well as thermal effects result in carbon-carbon bond breaking and redeposition leading to nanojunction formation. The growth mechanism of the nanojunction is believed to be open-ended topological defect growth in which carbon atoms at two adjacent nanotube tips chemically react and fuse forming an array of nanojunctions. © 2001 American Institute of Physics.|
|Source Title:||Applied Physics Letters|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on May 19, 2018
WEB OF SCIENCETM
checked on Apr 2, 2018
checked on May 18, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.