Please use this identifier to cite or link to this item:
|Title:||Effects of microstructure on the properties of ferroelectric lead zirconate titanate (PZT) thin films|
|Authors:||Goh, W.C. |
|Citation:||Goh, W.C., Yao, K., Ong, C.K. (2005-10). Effects of microstructure on the properties of ferroelectric lead zirconate titanate (PZT) thin films. Applied Physics A: Materials Science and Processing 81 (5) : 1089-1093. ScholarBank@NUS Repository. https://doi.org/10.1007/s00339-004-2964-8|
|Abstract:||Lead zirconate titanate (PZT) thin films were prepared with pulsed laser deposition and sol-gel techniques. The PZT films fabricated by these two techniques have similar randomly oriented single perovskite phases, but the film derived from the pulsed laser deposition exhibits a more compact and flat morphology. The dielectric, ferroelectric, and piezoelectric properties of the two kinds of films are comparatively characterized and discussed. It is observed that a denser microstructure would lead to a significantly higher dielectric constant and remanent polarization and a much lower coercive electric field, but only a relatively slight enhancement on the piezoelectric constant. The film with a looser microstructure could have a substantially higher piezoelectric voltage constant g33 due to the much lower dielectric constant. Our results and discussion provide a better understanding of the relationship between the microstructure and the film properties, which is essential in order to tailor the microstructure and hence determine the performance aiming at a specific application. © Springer-Verlag 2004.|
|Source Title:||Applied Physics A: Materials Science and Processing|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on May 20, 2018
WEB OF SCIENCETM
checked on Apr 18, 2018
checked on May 11, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.