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https://doi.org/10.1021/la703231h
DC Field | Value | |
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dc.title | Effect of tip size on force measurement in atomic force microscopy | |
dc.contributor.author | Lim, L.T.W. | |
dc.contributor.author | Wee, A.T.S. | |
dc.contributor.author | O'Shea, S.J. | |
dc.date.accessioned | 2014-10-16T09:22:22Z | |
dc.date.available | 2014-10-16T09:22:22Z | |
dc.date.issued | 2008-03-18 | |
dc.identifier.citation | Lim, L.T.W., Wee, A.T.S., O'Shea, S.J. (2008-03-18). Effect of tip size on force measurement in atomic force microscopy. Langmuir 24 (6) : 2271-2273. ScholarBank@NUS Repository. https://doi.org/10.1021/la703231h | |
dc.identifier.issn | 07437463 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/96346 | |
dc.description.abstract | An atomic force microscope (AFM) has been used to study solvation forces at the solid-liquid interface between highly oriented pyrolytic graphite (HOPG) and the liquids octamethylcyclotetrasiloxane (OMCTS), n-hexadecane (K-C9 16H34), and n-dodecanol (n-C11H 23CH2OH). Oscillatory solvation forces (F) are observed for various measured tip radii (Rtip = 15-100 nm). It is found that the normalized force data, F/Rtip, differ between AFM tips with a clear trend of decreasing F/Rtip with increasing Rtip. © 2008 American Chemical Society. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1021/la703231h | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | PHYSICS | |
dc.description.doi | 10.1021/la703231h | |
dc.description.sourcetitle | Langmuir | |
dc.description.volume | 24 | |
dc.description.issue | 6 | |
dc.description.page | 2271-2273 | |
dc.description.coden | LANGD | |
dc.identifier.isiut | 000253941000003 | |
Appears in Collections: | Staff Publications |
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