Please use this identifier to cite or link to this item:
https://doi.org/10.1021/la703231h
Title: | Effect of tip size on force measurement in atomic force microscopy | Authors: | Lim, L.T.W. Wee, A.T.S. O'Shea, S.J. |
Issue Date: | 18-Mar-2008 | Citation: | Lim, L.T.W., Wee, A.T.S., O'Shea, S.J. (2008-03-18). Effect of tip size on force measurement in atomic force microscopy. Langmuir 24 (6) : 2271-2273. ScholarBank@NUS Repository. https://doi.org/10.1021/la703231h | Abstract: | An atomic force microscope (AFM) has been used to study solvation forces at the solid-liquid interface between highly oriented pyrolytic graphite (HOPG) and the liquids octamethylcyclotetrasiloxane (OMCTS), n-hexadecane (K-C9 16H34), and n-dodecanol (n-C11H 23CH2OH). Oscillatory solvation forces (F) are observed for various measured tip radii (Rtip = 15-100 nm). It is found that the normalized force data, F/Rtip, differ between AFM tips with a clear trend of decreasing F/Rtip with increasing Rtip. © 2008 American Chemical Society. | Source Title: | Langmuir | URI: | http://scholarbank.nus.edu.sg/handle/10635/96346 | ISSN: | 07437463 | DOI: | 10.1021/la703231h |
Appears in Collections: | Staff Publications |
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.