Please use this identifier to cite or link to this item: https://doi.org/10.1021/la703231h
Title: Effect of tip size on force measurement in atomic force microscopy
Authors: Lim, L.T.W.
Wee, A.T.S. 
O'Shea, S.J.
Issue Date: 18-Mar-2008
Citation: Lim, L.T.W., Wee, A.T.S., O'Shea, S.J. (2008-03-18). Effect of tip size on force measurement in atomic force microscopy. Langmuir 24 (6) : 2271-2273. ScholarBank@NUS Repository. https://doi.org/10.1021/la703231h
Abstract: An atomic force microscope (AFM) has been used to study solvation forces at the solid-liquid interface between highly oriented pyrolytic graphite (HOPG) and the liquids octamethylcyclotetrasiloxane (OMCTS), n-hexadecane (K-C9 16H34), and n-dodecanol (n-C11H 23CH2OH). Oscillatory solvation forces (F) are observed for various measured tip radii (Rtip = 15-100 nm). It is found that the normalized force data, F/Rtip, differ between AFM tips with a clear trend of decreasing F/Rtip with increasing Rtip. © 2008 American Chemical Society.
Source Title: Langmuir
URI: http://scholarbank.nus.edu.sg/handle/10635/96346
ISSN: 07437463
DOI: 10.1021/la703231h
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