Please use this identifier to cite or link to this item:
|Title:||Dynamics of optical nonlinearity of Ge nanocrystals in a silica matrix|
|Authors:||Jie, Y.X. |
|Source:||Jie, Y.X.,Xiong, Y.N.,Wee, A.T.S.,Huan, C.H.A.,Ji, W. (2000-12-11). Dynamics of optical nonlinearity of Ge nanocrystals in a silica matrix. Applied Physics Letters 77 (24) : 3926-3928. ScholarBank@NUS Repository.|
|Abstract:||The optical nonlinearity and excited carrier lifetime in Ge nanocrystals (nc-Ge) embedded in a silica matrix have been investigated by means of single beam z scan and pump-probe techniques with laser pulse duration of 35 ps and 532 nm wavelength. The nc-Ge samples were prepared using magnetron cosputtering and postgrowth annealing at 800 °C. The nonlinear absorption coefficient α2 and refractive index n2 were found to range between 190 and 760 cm/GW, and 0.0026 and 0.0082 cm2/GW, respectively, and be proportional to the Ge concentration in the film. The confined excited carriers were found to depopulate with a lifetime of ∼70 ps. The nonlinearity in Ge nanocrystals is deduced to originate mainly from excited carrier absorption, with two-photon absorption providing a small contribution. © 2000 American Institute of Physics.|
|Source Title:||Applied Physics Letters|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Feb 17, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.