Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1428628
DC FieldValue
dc.titleDetermination of coverage in passivated porous silicon by Brillouin spectroscopy
dc.contributor.authorFan, H.J.
dc.contributor.authorKuok, M.H.
dc.contributor.authorNg, S.C.
dc.contributor.authorBoukherroub, R.
dc.contributor.authorLockwood, D.J.
dc.date.accessioned2014-10-16T09:20:37Z
dc.date.available2014-10-16T09:20:37Z
dc.date.issued2001-12-31
dc.identifier.citationFan, H.J., Kuok, M.H., Ng, S.C., Boukherroub, R., Lockwood, D.J. (2001-12-31). Determination of coverage in passivated porous silicon by Brillouin spectroscopy. Applied Physics Letters 79 (27) : 4521-4523. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1428628
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/96193
dc.description.abstractBrillouin scattering has been performed to probe surface acoustic waves in porous silicon films that have been chemically modified with various surface passivators. The surface Rayleigh mode and two film acoustic modes are observed. Unlike the Rayleigh mode, the two film modes are found to exhibit velocity dispersion. The effect of passivation is manifested as a shift of Brillouin peaks to lower frequencies relative to those of the freshly prepared porous silicon samples. The coverage of the surface area of the pores of the entire porous layers by the respective chemical passivators has been estimated from the phase velocity of one of the film modes. © 2001 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1428628
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.1428628
dc.description.sourcetitleApplied Physics Letters
dc.description.volume79
dc.description.issue27
dc.description.page4521-4523
dc.description.codenAPPLA
dc.identifier.isiut000172835400015
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