Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1428628
Title: Determination of coverage in passivated porous silicon by Brillouin spectroscopy
Authors: Fan, H.J.
Kuok, M.H. 
Ng, S.C. 
Boukherroub, R.
Lockwood, D.J.
Issue Date: 31-Dec-2001
Citation: Fan, H.J., Kuok, M.H., Ng, S.C., Boukherroub, R., Lockwood, D.J. (2001-12-31). Determination of coverage in passivated porous silicon by Brillouin spectroscopy. Applied Physics Letters 79 (27) : 4521-4523. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1428628
Abstract: Brillouin scattering has been performed to probe surface acoustic waves in porous silicon films that have been chemically modified with various surface passivators. The surface Rayleigh mode and two film acoustic modes are observed. Unlike the Rayleigh mode, the two film modes are found to exhibit velocity dispersion. The effect of passivation is manifested as a shift of Brillouin peaks to lower frequencies relative to those of the freshly prepared porous silicon samples. The coverage of the surface area of the pores of the entire porous layers by the respective chemical passivators has been estimated from the phase velocity of one of the film modes. © 2001 American Institute of Physics.
Source Title: Applied Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/96193
ISSN: 00036951
DOI: 10.1063/1.1428628
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