Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/96156
Title: Defect plasmons using recurrence relations
Authors: Sy, H.K. 
Issue Date: 27-Mar-1995
Citation: Sy, H.K. (1995-03-27). Defect plasmons using recurrence relations. Physics Letters A 199 (3-4) : 233-240. ScholarBank@NUS Repository.
Abstract: We study the plasmons in a finite semiconductor superlattice in which there is an inner defect layer of different charge density. The solutions of the recurrence relations, obtained by matching boundary conditions, are used to obtain a general equation for the frequencies of all the modes. Numerical results are given when only the localised mode is the defect mode, and when the defect mode interacts with the two dielectric surface modes. © 1995.
Source Title: Physics Letters A
URI: http://scholarbank.nus.edu.sg/handle/10635/96156
ISSN: 03759601
Appears in Collections:Staff Publications

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