Please use this identifier to cite or link to this item:
https://doi.org/10.1016/j.jmmm.2013.09.003
| Title: | Comparison of the microstructure and magnetic properties of strontium hexaferrite films deposited on Al2O3(0001), Si(100)/Pt(111) and Si(100) substrates by pulsed laser technique | Authors: | Masoudpanah, S.M. Seyyed Ebrahimi, S.A. Ong, C.K. |
Keywords: | Al2O3(0001) substrate Perpendicular magnetic anisotropy Pt(111) buffer layer Si(100) substrate Strontium hexaferrite film |
Issue Date: | 2014 | Citation: | Masoudpanah, S.M., Seyyed Ebrahimi, S.A., Ong, C.K. (2014). Comparison of the microstructure and magnetic properties of strontium hexaferrite films deposited on Al2O3(0001), Si(100)/Pt(111) and Si(100) substrates by pulsed laser technique. Journal of Magnetism and Magnetic Materials 350 : 81-85. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jmmm.2013.09.003 | Abstract: | Strontium hexaferrite SrFe12O19 (SrM) films have been deposited on Al2O3(0001), Si(100)/Pt(111) and Si(100) substrates. The (001) oriented SrFe12O19 films deposited on the Al2O3(0001) and Si(100)/Pt(111) substrates have been confirmed by X-ray diffraction patterns. Higher coercivity in perpendicular direction rather than in-plane direction of the SrM/Al2O 3(0001) and SrM/Pt(111) films showed that the films had perpendicular magnetic anisotropy. The (001) orientation and similar microstructure and magnetic properties of the SrM/Al2O3(0001) and SrM/Pt(111) films show the Al2O3(0001) substrate can be replaced by the Si(100)/Pt(111) substrate. © 2013 Elsevier B.V. | Source Title: | Journal of Magnetism and Magnetic Materials | URI: | http://scholarbank.nus.edu.sg/handle/10635/96034 | ISSN: | 03048853 | DOI: | 10.1016/j.jmmm.2013.09.003 |
| Appears in Collections: | Staff Publications |
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.