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|Title:||Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO3 thin film grown on SrTiO3 substrate by laser molecular beam epitaxy|
|Authors:||Chen, P. |
|Citation:||Chen, P.,Xu, S.Y.,Lin, J.,Ong, C.K.,Cui, D.F. (1999-01-01). Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO3 thin film grown on SrTiO3 substrate by laser molecular beam epitaxy. Applied Surface Science 137 (1-3) : 98-102. ScholarBank@NUS Repository.|
|Abstract:||The LaNiO3 thin film was grown on SrTiO3 (001) substrate by computer-controlled laser molecular beam epitaxy (laser MBE). In situ monitoring of the growing film surface was performed with a reflection high energy electron diffraction (RHEED). Angle-resolved X-ray photoelectron spectroscopy (ARXPS) indicated that the terminating plane of the LaNiO3 film was the LaO atomic plane, and the SrTiO3 (001) surfaces of as-supplied substrate as well as HF-pretreated substrate were predominantly terminated with TiO atomic plane. The structural conversion of the topmost atomic layer from NiO to LaO occurred during the LaNiO3 epitaxial growth process. © 1999 Elsevier Science B.V. All rights reserved.|
|Source Title:||Applied Surface Science|
|Appears in Collections:||Staff Publications|
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