Please use this identifier to cite or link to this item: https://doi.org/10.1002/mop.23141
Title: Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film
Authors: Wang, P. 
Tan, C.Y. 
Ma, Y.G. 
Cheng, W.N.
Ong, C.K. 
Keywords: BST
Dielectric measurements
Ferroelectric
Interdigital capacitor
Varactor
Issue Date: Mar-2008
Citation: Wang, P., Tan, C.Y., Ma, Y.G., Cheng, W.N., Ong, C.K. (2008-03). Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film. Microwave and Optical Technology Letters 50 (3) : 566-568. ScholarBank@NUS Repository. https://doi.org/10.1002/mop.23141
Abstract: A procedure to include conductor loss in interdigital capacitor based dielectric constant measurements is proposed. The effect of conductor loss and contact resistance can be regarded as a series resistor connected to the interdigital capacitor. If the thickness of the conductor film is known, the conductor loss could be calculated and subtracted from the measurement results. In the frequency range where the dielectric constant of the material in test does not change with frequency, the conductor loss could also be obtained by measuring the frequency dependence of the impedance of the interdigital capacitor. © 2008 Wiley Periodicals, Inc.
Source Title: Microwave and Optical Technology Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/95769
ISSN: 08952477
DOI: 10.1002/mop.23141
Appears in Collections:Staff Publications

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