Please use this identifier to cite or link to this item:
|Title:||A novel scanning electron microscope method for the investigation of charge trapping in insulators|
|Authors:||Gong, H. |
|Citation:||Gong, H., Ong, C.K. (1994). A novel scanning electron microscope method for the investigation of charge trapping in insulators. Journal of Applied Physics 75 (1) : 449-453. ScholarBank@NUS Repository. https://doi.org/10.1063/1.355873|
|Abstract:||A new technique using a copper detector in a scanning electron microscope is introduced for the investigation of charging in insulators, and pure single-crystalline α-quartz samples are studied. The curve of charging rate varying with time is obtained, and the total charge trapped in the sample is accurately determined. Furthermore, the effects of electron-beam energy and current on charging are also examined. Our results suggest that electron-radiation-induced defects in the sample play major roles in the charge trapping. Details of the experimental setup are given.|
|Source Title:||Journal of Applied Physics|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Oct 20, 2018
WEB OF SCIENCETM
checked on Oct 3, 2018
checked on Oct 12, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.