Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.355873
Title: A novel scanning electron microscope method for the investigation of charge trapping in insulators
Authors: Gong, H. 
Ong, C.K. 
Issue Date: 1994
Citation: Gong, H., Ong, C.K. (1994). A novel scanning electron microscope method for the investigation of charge trapping in insulators. Journal of Applied Physics 75 (1) : 449-453. ScholarBank@NUS Repository. https://doi.org/10.1063/1.355873
Abstract: A new technique using a copper detector in a scanning electron microscope is introduced for the investigation of charging in insulators, and pure single-crystalline α-quartz samples are studied. The curve of charging rate varying with time is obtained, and the total charge trapped in the sample is accurately determined. Furthermore, the effects of electron-beam energy and current on charging are also examined. Our results suggest that electron-radiation-induced defects in the sample play major roles in the charge trapping. Details of the experimental setup are given.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/95663
ISSN: 00218979
DOI: 10.1063/1.355873
Appears in Collections:Staff Publications

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