Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0039-9140(97)00294-4
Title: Characterization of atomic force microscopy (AFM) tip shapes by scanning hydrothermally deposited ZnO thin films
Authors: Bao, G.W.
Li, S.F.Y. 
Keywords: Atomic force microscopy
Tip shapes
ZnO thin films
Issue Date: Feb-1998
Citation: Bao, G.W., Li, S.F.Y. (1998-02). Characterization of atomic force microscopy (AFM) tip shapes by scanning hydrothermally deposited ZnO thin films. Talanta 45 (4) : 751-757. ScholarBank@NUS Repository. https://doi.org/10.1016/S0039-9140(97)00294-4
Abstract: Direct observation of tip shapes by atomic force microscopy (AFM) has been achieved using spike-like crystallites in ZnO thin films deposited on microscope glass slides by the hydrothermal deposition technique. Three types of AFM tips, e.g. standard Si3N4 tips, a broken silicon supertip and a noncontact silicon tip were examined and the acquired images for these tips show that ZnO crystallites are good samples to image commonly used AFM tips. The most obvious characteristic of this method is that it is easy for every chemical laboratory to access.
Source Title: Talanta
URI: http://scholarbank.nus.edu.sg/handle/10635/95443
ISSN: 00399140
DOI: 10.1016/S0039-9140(97)00294-4
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