Please use this identifier to cite or link to this item:
|Title:||Oxidation and growth of Mg thin films on Ru(001)|
|Authors:||Huang, H.H. |
|Citation:||Huang, H.H., Jiang, X., Siew, H.L., Chin, W.S., Sim, W.S., Xu, G.Q. (1999-08-10). Oxidation and growth of Mg thin films on Ru(001). Surface Science 436 (1) : 167-174. ScholarBank@NUS Repository. https://doi.org/10.1016/S0039-6028(99)00660-3|
|Abstract:||The oxidation and growth of ultra-thin Mg films on a Ru(001) substrate have been studied using X-ray photoelectron spectroscopy (XPS) and thermal desorption spectroscopy (TDS) in the temperature range of 300-1500 K. Our results suggest that the growth of Mg thin films follows a layer-by-layer mode. Upon oxygen adsorption at 300 K, two O 1s peaks were detected on the Mg film. The peak at 532.2-532.6 eV could be attributed to either dioxygen or partially reduced species (Oδ-, δ < 2), whereas that at 530.1-530.6 eV is due to lattice oxygen in MgO. Annealing of the oxidized film to 800 K causes the conversion of the dioxygen or partially reduced species to the oxide state. Thermal desorption peaks of MgO were directly detected at 1000-1127 and 1350-1380 K, respectively. However, initial evaporation of Mg atoms onto an oxygen pre-adsorbed surface yields a fully oxidized MgO. Further Mg deposition results in the formation of a partially oxidized film with the observation of an O 1s peak at 532.2 eV.|
|Source Title:||Surface Science|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Sep 19, 2018
WEB OF SCIENCETM
checked on Sep 10, 2018
checked on Jul 20, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.