Please use this identifier to cite or link to this item: https://doi.org/10.1039/b511981b
DC FieldValue
dc.titleLa2S3 thin films from metal organic chemical vapor deposition of single-source precursor
dc.contributor.authorTian, L.
dc.contributor.authorOuyang, T.
dc.contributor.authorLoh, K.P.
dc.contributor.authorVittal, J.J.
dc.date.accessioned2014-10-16T08:32:26Z
dc.date.available2014-10-16T08:32:26Z
dc.date.issued2006
dc.identifier.citationTian, L., Ouyang, T., Loh, K.P., Vittal, J.J. (2006). La2S3 thin films from metal organic chemical vapor deposition of single-source precursor. Journal of Materials Chemistry 16 (3) : 272-277. ScholarBank@NUS Repository. https://doi.org/10.1039/b511981b
dc.identifier.issn09599428
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/94128
dc.description.abstractThin films of lanthanum sulfide (La2S3) have been prepared from [La(bipy)(S2CNEt2)3] by using metal organic chemical vapor deposition (MOCVD) on different substrates. The preparative parameters, such as substrate temperature and the nature of substrates, are optimized to get well-defined cubic phase (γ) lanthanum sulfide thin films. The optimized films are characterized by means of X-ray powder diffraction (XRPD) techniques, scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM) and in-situ X-ray photoelectron spectroscopy (XPS). © the Royal Society of Chemistry 2006.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1039/b511981b
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentCHEMISTRY
dc.description.doi10.1039/b511981b
dc.description.sourcetitleJournal of Materials Chemistry
dc.description.volume16
dc.description.issue3
dc.description.page272-277
dc.description.codenJMACE
dc.identifier.isiut000234887700016
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