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|Title:||The dynamic response of a hot-wire anemometer: III. Voltage-perturbation versus velocity-perturbation testing for near-wall hot-wire/film probes|
|Authors:||Khoo, B.C. |
Flush-mounted hot wire
Hot-film wall shear-stress gauge
Near-wall hot wire
|Source:||Khoo, B.C.,Chew, Y.T.,Teo, C.J.,Lim, C.P. (1999-03). The dynamic response of a hot-wire anemometer: III. Voltage-perturbation versus velocity-perturbation testing for near-wall hot-wire/film probes. Measurement Science and Technology 10 (3) : 152-169. ScholarBank@NUS Repository. https://doi.org/3/009|
|Abstract:||Experiments were performed for the first time using the electronic square-wave voltage-perturbation test to systematically quantify the frequency response (fS) of near-wall hot-wire probes subjected in turn to varying magnitudes of convective velocity, different substrate materials and changes in wall-substrate temperature. In addition, quartz-substrate hot-film gauges with various thicknesses of quartz coating were also tested. Results of fS were compared against the dynamic frequency response (fD) previously obtained in parts I and II using a known near-wall fluctuating flow field. Although the observed trends for fD and fS were similar, their magnitudes were vastly different, notably for the commercially available hot-film gauges, or which fS was up to five orders of magnitude greater than fD. This signifies that there are possibly inherent differences between square-wave voltage-perturbation and velocity-perturbation tests for quantifying the frequency response of a hot-wire/hot-film system. These differences are then analysed in relation to the equation of a CTA unit put forth by Freymuth.|
|Source Title:||Measurement Science and Technology|
|Appears in Collections:||Staff Publications|
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