Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0032-3861(02)00263-X
Title: Electroless plating of copper on polyimide films modified by surface grafting of tertiary and quaternary amines polymers
Authors: Yu, Z.J.
Kang, E.T. 
Neoh, K.G. 
Keywords: Electroless plating
Graft copolymerization
Polyimides
Issue Date: 23-May-2002
Citation: Yu, Z.J., Kang, E.T., Neoh, K.G. (2002-05-23). Electroless plating of copper on polyimide films modified by surface grafting of tertiary and quaternary amines polymers. Polymer 43 (15) : 4137-4146. ScholarBank@NUS Repository. https://doi.org/10.1016/S0032-3861(02)00263-X
Abstract: Argon plasma-pretreated polyimide (PI, Kapton® HN) films were subjected to UV-induced surface graft copolymerization with N,N1-(dimethylamino)ethyl methacrylate (DMAEMA) and 2-(trimethylammonium)ethyl methacrylate chloride (TMMAC). The DMAEMA graft-copolymerized PI (DMAEMA-g-PI) surfaces were also quaternized and amino-functionalized with 3-bromopropylamine hydrobromide (the Q-DMAEMA-g-PI surfaces). The surface composition and the degree of quaternization of the graft-modified PI films were determined by X-ray photoelectron spectroscopy. The DMAEMA-g-PI, Q-DMAEMA-g-PI and TMMAC graft-copolymerized PI (TMMAC-g-PI) surfaces can be activated directly by PdCl2, in the absence of prior sensitization by SnCl2 (the 'Sn-free' activation process), for the subsequent electroless plating of copper. A shorter induction time for the electroless deposition of copper was found for the palladium-activated QDMAEMA-g-PI and TMMAC-g-PI surfaces than for the palladium-activated DMAEMA-g-PI surface. The T-peel adhesion strength of the electrolessly deposited copper with the Q-DMAEMA-g-PI surface was enhanced to above 6 N/cm, in comparison to only about 4 N/cm for the DMAEMA-g-PI surface, about 2.5 N/cm for the TMMAC-g-PI surface, or about 0.5 N/cm for the PI surface with argon plasma treatment alone. © 2002 Elsevier Science Ltd. All rights reserved.
Source Title: Polymer
URI: http://scholarbank.nus.edu.sg/handle/10635/91966
ISSN: 00323861
DOI: 10.1016/S0032-3861(02)00263-X
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