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Title: On measurement systems in the IC assembly industry
Authors: Lai, Y.W.
Duan, C.M. 
Chew, E.P. 
Issue Date: 1995
Citation: Lai, Y.W.,Duan, C.M.,Chew, E.P. (1995). On measurement systems in the IC assembly industry. IEEE International Engineering Management Conference : 412-417. ScholarBank@NUS Repository.
Abstract: This paper examines the need for and identifies approaches to development and maintaining an effective measurement system in the Integrated Circuit (IC) assembly industry. As the specification's window goes narrower, the variance components in a measurement system which contribute to the measurement uncertainty are discussed. Four approaches for establishing measurement system in the IC assembly industry is examined. A conceptual framework for effective measurement systems to manage the uncertainty in the IC assembly industry is advocated.
Source Title: IEEE International Engineering Management Conference
Appears in Collections:Staff Publications

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