Please use this identifier to cite or link to this item:
|Title:||Selecting the most reliable population under step-stress accelerated life test|
|Authors:||Tang, L.C. |
Least favorable configuration
|Citation:||Tang, L.C.,Sun, Y. (1999). Selecting the most reliable population under step-stress accelerated life test. International Journal of Reliability, Quality and Safety Engineering 6 (4) : 347-359. ScholarBank@NUS Repository.|
|Abstract:||Wo present a method for selecting the most reliable population under step-stress accelerated life testing with typo II censoring. We construct a new statistic, the transitional order statistic (TOS), and derive an approximate expression for its distribution. Using the TOS, a selection rule is formulated from the test results. For planning purposes, we establish the relation between sample size and the probability of correct selection by defining a nonlinear indifference zone under the least favorable configuration. Finally, a simulation study is performed to illustrate the selection procedure and to validate the associated probability of correct selection. © World Scientific Publishing Company.|
|Source Title:||International Journal of Reliability, Quality and Safety Engineering|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Nov 9, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.