Please use this identifier to cite or link to this item: https://doi.org/10.1109/24.475974
Title: Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies
Authors: Tang, Loon Ching 
Chang, Dong Shang
Issue Date: Dec-1995
Source: Tang, Loon Ching,Chang, Dong Shang (1995-12). Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies. IEEE Transactions on Reliability 44 (4) : 562-566. ScholarBank@NUS Repository. https://doi.org/10.1109/24.475974
Abstract: This paper describes a conceptual framework for reliability evaluation from nondestructive accelerated degradation data (NADD). A numerical example of data sets from power supply units for electronic products is presented using this framework. We model NADD as a collection of stochastic processes for which the parameters depend on the stress levels. The relationship between these parameters and the associated stresses is explored using regression. The failure-time of power-supply units is modeled by the Birnbaum-Saunders distribution, for which the confidence bounds and tolerance limits can be easily obtained.
Source Title: IEEE Transactions on Reliability
URI: http://scholarbank.nus.edu.sg/handle/10635/87206
ISSN: 00189529
DOI: 10.1109/24.475974
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