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|Title:||Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies|
|Authors:||Tang, Loon Ching |
Chang, Dong Shang
|Source:||Tang, Loon Ching,Chang, Dong Shang (1995-12). Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies. IEEE Transactions on Reliability 44 (4) : 562-566. ScholarBank@NUS Repository. https://doi.org/10.1109/24.475974|
|Abstract:||This paper describes a conceptual framework for reliability evaluation from nondestructive accelerated degradation data (NADD). A numerical example of data sets from power supply units for electronic products is presented using this framework. We model NADD as a collection of stochastic processes for which the parameters depend on the stress levels. The relationship between these parameters and the associated stresses is explored using regression. The failure-time of power-supply units is modeled by the Birnbaum-Saunders distribution, for which the confidence bounds and tolerance limits can be easily obtained.|
|Source Title:||IEEE Transactions on Reliability|
|Appears in Collections:||Staff Publications|
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