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https://doi.org/10.1109/TR.2013.2255792
Title: | Planning accelerated life tests under scheduled inspections for log-location-scale distributions | Authors: | Liu, X. Tang, L.-C. |
Keywords: | Accelerated life test design of experiments optimal spacing scheduled inspections |
Issue Date: | 2013 | Citation: | Liu, X., Tang, L.-C. (2013). Planning accelerated life tests under scheduled inspections for log-location-scale distributions. IEEE Transactions on Reliability 62 (2) : 515-526. ScholarBank@NUS Repository. https://doi.org/10.1109/TR.2013.2255792 | Abstract: | This paper proposes an efficient approach to planning an ALT under scheduled inspections. We aim to simultaneously optimize stress levels, sample allocation, and inspection times for lifetimes that follow log-location-scale life distributions, including Weibull and Lognormal distributions. Such a high-dimension optimization problem is solved by a computationally efficient approach leveraging on the asymptotic equivalence between the selection of sample quantiles for parameter estimation of a location-scale distribution and the selection of the optimal inspection times during an ALT for the same purpose. A numerical example is presented to illustrate the application of the proposed approach, and a sensitivity analysis is performed to investigate the robustness of the optimal ALT plans against misspecification of planning inputs. A computer program coded in the MATLAB Graphical User Interface Design Environment is provided to make our method readily applicable in practice. © 2012 IEEE. | Source Title: | IEEE Transactions on Reliability | URI: | http://scholarbank.nus.edu.sg/handle/10635/87170 | ISSN: | 00189529 | DOI: | 10.1109/TR.2013.2255792 |
Appears in Collections: | Staff Publications |
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