Please use this identifier to cite or link to this item:
|Title:||Optimal burn-in for repairable products sold with a two-dimensional warranty|
|Citation:||Ye, Z.-S., Murthy, D.N.P., Xie, M., Tang, L.-C. (2013-02-01). Optimal burn-in for repairable products sold with a two-dimensional warranty. IIE Transactions (Institute of Industrial Engineers) 45 (2) : 164-176. ScholarBank@NUS Repository. https://doi.org/10.1080/0740817X.2012.677573|
|Abstract:||Warranty data analyses reveal that products sold with two-dimensional warranties may have significant infant mortalities. To deal with this problem, this article proposes and studies a new burn-in modeling approach for repairable products sold with a two-dimensional warranty. More specifically, two types of failures are characterizedi.e., normal and defect failuresand performance and cost-based burn-in models are developed under the non-renewing free-repair warranty policy. The proposed models subsume the special cases of a one-dimensional warranty, allow different failure modes to have distinct accelerated relationships, and take consumer usage heterogeneity into consideration. Under mild assumptions, it is established that the optimal burn-in usage rate should be as high as possible, provided that no extraneous failure modes are introduced. Furthermore, It is shown that the optimal burn-in duration determined from the performance-based model is not shorter than that from the cost-based model. Numerical examples are used to demonstrate the benefits of burn-in. In addition, some practical implications from a sensitivity analysis are elaborated. © 2013 Copyright Taylor and Francis Group, LLC.|
|Source Title:||IIE Transactions (Institute of Industrial Engineers)|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jul 12, 2018
WEB OF SCIENCETM
checked on Jun 5, 2018
checked on Jul 6, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.