Please use this identifier to cite or link to this item:
|Title:||Well-isolated L1 0 FePt-SiN x-C nanocomposite films with large coercivity and small grain size|
|Citation:||Dong, K.F., Li, H.H., Peng, Y.G., Ju, G., Chow, G.M., Chen, J.S. (2012-04-01). Well-isolated L1 0 FePt-SiN x-C nanocomposite films with large coercivity and small grain size. Journal of Applied Physics 111 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3671430|
|Abstract:||FePt-SiN x-C films on TiN/CrRu/glass substrate with large coercivity, (001) texture, and small isolated grains were obtained by co-sputtering FePt, Si 3N 4, and C targets at 380°C. It was found that when C was doped into the FePt-SiN x films, the out-of-plane coercivity increased while the small in-plane coercivity remained unchanged. Grain size decreased and grain size distribution became more uniform with increasing the C doping concentration. The x-ray photoelectron spectroscopy (XPS) depth profile showed a uniform depth distribution of Si in the FePt layer. The Si2p XPS spectrum implied the existence of Fe-Si bonds, indicating that SiN x was located at the FePt grain boundaries and was stable against diffusion to the surface, thus favoring grain isolation. Well-isolated FePt (001) granular films with coercivity higher than 21.5 kOe and an average grain size of 5.6 nm were obtained by doping 40 vol. of SiN x and 20 vol. of C. © 2012 American Institute of Physics.|
|Source Title:||Journal of Applied Physics|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jul 21, 2018
WEB OF SCIENCETM
checked on Jun 11, 2018
checked on Jul 6, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.