Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/86969
Title: Thickness dependent evolution of microstructure and magnetic properties of L10 (001) FePt films grown on TiN intermediate layer
Authors: Li, H.H.
Dong, K.F.
Hu, J.F.
Zhou, T.J.
Chow, G.M. 
Chen, J.S. 
Keywords: FePt
Thickness evolution
TiN
Issue Date: 2012
Citation: Li, H.H.,Dong, K.F.,Hu, J.F.,Zhou, T.J.,Chow, G.M.,Chen, J.S. (2012). Thickness dependent evolution of microstructure and magnetic properties of L10 (001) FePt films grown on TiN intermediate layer. 2012 Digest APMRC - Asia-Pacific Magnetic Recording Conference: A Strong Tradition. An Exciting New Look! : -. ScholarBank@NUS Repository.
Abstract: The evolution of the microstructure and magnetic properties of FePt films with different thicknesses fabricated by dc magnetron sputtering on TiN intermediate layer were investigated. MFM results showed that the magnetization reversal mechanism changed from Stoner-Wohlfarth rotation to domain wall motion with increasing film thickness. SEM and TEM images revealed that the morphologies of the films evolved from island particle to maze-like grains and then continuous films with the increase of the FePt film thickness. The critical thickness for FePt/TiN epitaxial growth was estimated to be 10 nm by lattice constant simulation and TEM measurement. The lattice relaxation in the FePt film of 40 nm was determined by high-resolution TEM images. © 2012 DSI.
Source Title: 2012 Digest APMRC - Asia-Pacific Magnetic Recording Conference: A Strong Tradition. An Exciting New Look!
URI: http://scholarbank.nus.edu.sg/handle/10635/86969
ISBN: 9789810720568
Appears in Collections:Staff Publications

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