Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3564946
Title: Effects of CrRu-SiOx underlayer with MgO intermediate layer on the microstructure and magnetic properties of FePt-C thin film
Authors: Li, H.H.
Hu, J.F.
Ju, G.
Chow, G.M. 
Chen, J.S. 
Issue Date: 1-Apr-2011
Citation: Li, H.H., Hu, J.F., Ju, G., Chow, G.M., Chen, J.S. (2011-04-01). Effects of CrRu-SiOx underlayer with MgO intermediate layer on the microstructure and magnetic properties of FePt-C thin film. Journal of Applied Physics 109 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3564946
Abstract: The effect of the CrRu-SiOx underlayer with different doping concentrations and the thickness of the CrRu underlayer on the microstructure and magnetic properties of FePt-C films were investigated. FePt films exhibited L10 (001) texture at various SiOx doping concentrations. The coercivities were as large as 28 kOe and the slope of M-H loop at coercivity was approximately equal to 1, suggesting that FePt grains were well exchange decoupled. Grain size was only slightly reduced after introducing the CrRu-SiOx underlayer. But the contact angle between the FePt grains and the MgO intermediate layer around 135 indicated the a MgO intermediate layer was not favored for smaller grains to obtain good L10 (001) texture. X-ray photoelectron spectroscopy in-depth profile showed that Si diffused into a whole FePt-C layer and C diffused to the film surface. © 2011 American Institute of Physics.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/86875
ISSN: 00218979
DOI: 10.1063/1.3564946
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