Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3596826
Title: Valence-driven electrical behavior of manganese-modified bismuth ferrite thin films
Authors: Wu, J. 
Wang, J. 
Xiao, D.
Zhu, J.
Issue Date: 15-Jun-2011
Citation: Wu, J., Wang, J., Xiao, D., Zhu, J. (2011-06-15). Valence-driven electrical behavior of manganese-modified bismuth ferrite thin films. Journal of Applied Physics 109 (12) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3596826
Abstract: BiFe0.95R0.05O3 (Mn2, Mn 3+, and Mn4) thin films with (110) orientation were fabricated on SrRuO3/Pt/TiO2/SiO2/Si(100) substrates via rf sputtering. With the increasing valence of Mn in BiFe 0.95R0.05O3, the concentration of Fe 2 increases, whereas the concentration of oxygen vacancies decreases. The electrical properties of BiFe0.95R0.05O3 are correlated with the valence of Mn. Their leakage current density is dependent on the concentration of oxygen vacancies caused by different valences of Mn. Their P-E loops become better with the increasing valence of Mn owing to a lower leakage current density in high electric field regions, and a large remanent polarization of 2Pr ∼ 145.2 μC/cm2 is obtained for the Mn4-doped film. For the Mn2-doped bismuth ferrite film, the space-charge-limited conduction and Schottky barrier dominate its leakage behavior under a negative electric field, the Ohmic conduction and Schottky barrier are involved in the leakage behavior under a positive electric field, and the interface-limited Fowler-Nordheim tunneling is their dominant mechanism in a high electric field region. In contrast, an Ohmic conduction dominates the leakage behavior of Mn3+- and Mn4-doped films regardless of negative and positive directions or measurement temperatures. © 2011 American Institute of Physics.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/86838
ISSN: 00218979
DOI: 10.1063/1.3596826
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