Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.jmmm.2011.12.006
Title: Study of magnetization reversal of Co/Pd bit-patterned media by micro-magnetic simulation
Authors: Li, W.M. 
Yang, Y. 
Chen, Y.J.
Huang, T.L.
Shi, J.Z.
Ding, J. 
Keywords: Bit-patterned media
Dipolar interactions
Magnetization reversal
Switching field distribution (SFD)
Issue Date: Apr-2012
Citation: Li, W.M., Yang, Y., Chen, Y.J., Huang, T.L., Shi, J.Z., Ding, J. (2012-04). Study of magnetization reversal of Co/Pd bit-patterned media by micro-magnetic simulation. Journal of Magnetism and Magnetic Materials 324 (8) : 1575-1580. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jmmm.2011.12.006
Abstract: Bit-patterned media based on a single-bit-per-island may be a promising candidate for perpendicular magnetic recording at the Tb/in 2 level because they could provide a lower noise and higher density. The understanding of magnetization reversal processes in such patterned media is important. In this work, the range of single domain island size based on Co/Pd bit-patterned media was determined. Demagnetization effect, dipolar interactions and switching field distribution (SFD) for bit-patterned media were quantitatively studied by the simulation based on Landau-Lifshitz-Gilbert equation. The total hysteresis loops and SFD were comparable with the experiment ones. The SFD increased from 2σ=1.2 kOe (as the calculated intrinsic SFD) to the experimental value of 1.9 kOe due to dipolar interactions which is in a good agreement with the experimental results (2.0 kOe). Optimized patterned structure with a minimized SFD and maximized data storage densities was found to have an island size of 10 nm and islands separation of 20 nm. The calculated ratio of SFD/H c (H c: the coercivity) is 9.2%, which is below the threshold of 10% for 1 Tb/in 2 pattern media. © 2011 Elsevier B.V. All rights reserved.
Source Title: Journal of Magnetism and Magnetic Materials
URI: http://scholarbank.nus.edu.sg/handle/10635/86742
ISSN: 03048853
DOI: 10.1016/j.jmmm.2011.12.006
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