Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.orgel.2012.12.017
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dc.titlePolymer:nanoparticle memory devices with electrode-sensitive bipolar resistive switches by exploring the electrical contact between a bulk metal and metal nanoparticles
dc.contributor.authorOuyang, J.
dc.date.accessioned2014-10-07T09:53:18Z
dc.date.available2014-10-07T09:53:18Z
dc.date.issued2013-02
dc.identifier.citationOuyang, J. (2013-02). Polymer:nanoparticle memory devices with electrode-sensitive bipolar resistive switches by exploring the electrical contact between a bulk metal and metal nanoparticles. Organic Electronics: physics, materials, applications 14 (2) : 665-675. ScholarBank@NUS Repository. https://doi.org/10.1016/j.orgel.2012.12.017
dc.identifier.issn15661199
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/86659
dc.description.abstractElectrode-sensitive bipolar resistive switches are observed on devices with a polystyrene film blended with gold nanoparticles capped with conjugated 2-naphthalenethiol (Au-2NT NPs) sandwiched between Al and Au electrodes. The bipolar resistive switches render the devices important application as nonvolatile memory devices. This manuscript reports the operation mechanism of these polymer:nanoparticle memory devices through the analyses of conduction mechanisms, investigation of the effects of the active film thickness and the Au-2NT NP loading on the resistive switches, and Raman spectroscopy of Au-2NT NPs for the devices in two resistance states. The electrical contact between the Al electrode and Au-2NT NPs plays a key role in the resistive switches. The total resistance for the charge transport through the polymer:nanoparticle memory devices includes the resistance (Rf) for the charge transport across the active polymer:nanoparticle film and the resistance (Rc) through the electrical contact between the active film and the Al electrode. Both resistances change during the resistive switches, but the change in R c is the dominant factor. The threshold voltage (Vth) for the resistive switch is predominantly affected by the contact between the active film and the Al electrode, and it also slightly depends on the thickness of the active film and the loading of Au-2NT NPs in the active film. The changes in Rc and Rf are ascribed to the effect of the external electric field on the charge transfer between the Al electrode and Au-2NT NPs and the electrical field-induced charge trapping on Au-2NT NPs, respectively. © 2012 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.orgel.2012.12.017
dc.sourceScopus
dc.subjectCharge storage
dc.subjectConjugated molecule
dc.subjectGold nanoparticle
dc.subjectOrganic memory
dc.subjectResistive switch
dc.typeArticle
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.doi10.1016/j.orgel.2012.12.017
dc.description.sourcetitleOrganic Electronics: physics, materials, applications
dc.description.volume14
dc.description.issue2
dc.description.page665-675
dc.description.codenOERLA
dc.identifier.isiut000314658700032
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