Please use this identifier to cite or link to this item:
Title: Nanocomposite L1 0 FePt-SiN x and FePt-SiN x-C films with large coercivity and small grain size on a TiN intermediate layer
Authors: Dong, K.F.
Li, H.H.
Peng, Y.G.
Ju, G.
Chow, G.M. 
Chen, J.S. 
Keywords: Large coercivity
Small grain size
TiN intermediate layer
Issue Date: Aug-2012
Citation: Dong, K.F., Li, H.H., Peng, Y.G., Ju, G., Chow, G.M., Chen, J.S. (2012-08). Nanocomposite L1 0 FePt-SiN x and FePt-SiN x-C films with large coercivity and small grain size on a TiN intermediate layer. Journal of Magnetism and Magnetic Materials 324 (17) : 2637-2644. ScholarBank@NUS Repository.
Abstract: FePt-SiN x-C films with high coercivity, (001) texture and small grain size were obtained by co-sputtering FePt, Si 3N 4 and C on TiN/CrRu/glass substrate at 380°C. Without C doping, FePt-SiN x films with good perpendicular anisotropy and a single layer structure were obtained. However, the grain size was still too large and the grain isolation was poor. When C was doped into the FePt-SiN x films, the out-of-plane coercivity increased due to the decrease of the exchange coupling. In addition, the grain size of the FePt films decreased, and well-separated FePt grains with uniform size were formed. The microstructure of [FePt-SiN x 40 vol%]-20 vol% C films changed from a single layer structure to a multiple layer structure when the FePt thickness was increased from 4 to 10 nm. By optimizing the sputtering process, the [FePt (4 nm)-SiN x 40 vol%]-20 vol% C (001) film with coercivity higher than 21.5 kOe, a single layer structure, and small average FePt grain size of 5.6 nm was obtained, which makes it suitable for ultrahigh density perpendicular recording. © 2012 Elsevier B.V.
Source Title: Journal of Magnetism and Magnetic Materials
ISSN: 03048853
DOI: 10.1016/j.jmmm.2012.03.027
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.


checked on Jun 14, 2018


checked on May 15, 2018

Page view(s)

checked on May 18, 2018

Google ScholarTM



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.