Please use this identifier to cite or link to this item: https://doi.org/10.1088/0022-3727/42/18/185007
Title: Crystallographic origin of perpendicular magnetic anisotropy in CoPt film: Polarized x-ray absorption study
Authors: Pandey, K.K.M. 
Chen, J.S. 
Liu, T. 
Sun, C.J.
Chow, G.M. 
Issue Date: 2009
Citation: Pandey, K.K.M., Chen, J.S., Liu, T., Sun, C.J., Chow, G.M. (2009). Crystallographic origin of perpendicular magnetic anisotropy in CoPt film: Polarized x-ray absorption study. Journal of Physics D: Applied Physics 42 (18) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/42/18/185007
Abstract: Crystallographic structure, growth induced miscibility gap and strain in Ta/Co100-xPtx (0 ≤ x ≤ 43 at%)/Ru/Ta/glass films deposited at ambient temperature were investigated using polarized x-ray absorption spectroscopy to clarify the origin of observed perpendicular magnetic anisotropy (PMA) in Co72Pt28 film. Extended x-ray absorption fine structure spectroscopy data at Co K-edge showed that Co has a similar local atomic environment and averaged interatomic distance in the in-plane and out-of-plane polarization geometries for Co72Pt 28, ruling out the contribution of magneto-elastic anisotropy and growth induced structural anisotropy as the origin of PMA. A large PMA in Co72Pt28 film was attributed to the preferred hexagonal close-packed stacking as observed using the x-ray absorption near-edge structure spectroscopy. © 2009 IOP Publishing Ltd.
Source Title: Journal of Physics D: Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/86245
ISSN: 00223727
DOI: 10.1088/0022-3727/42/18/185007
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