Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/86043
DC Field | Value | |
---|---|---|
dc.title | Non-destructive evaluation of compositional and property distributions in large-size relaxor single crystal wafers | |
dc.contributor.author | Lim, L.C. | |
dc.contributor.author | Kumar, F.J. | |
dc.date.accessioned | 2014-10-07T09:15:13Z | |
dc.date.available | 2014-10-07T09:15:13Z | |
dc.date.issued | 2001 | |
dc.identifier.citation | Lim, L.C.,Kumar, F.J. (2001). Non-destructive evaluation of compositional and property distributions in large-size relaxor single crystal wafers. Proceedings of the IEEE Ultrasonics Symposium 2 : 1043-1046. ScholarBank@NUS Repository. | |
dc.identifier.issn | 10510117 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/86043 | |
dc.description.abstract | A multi-probe non-destructive evaluation technique for quantifying the distribution of Curie temperature of large-size relaxor single crystal wafers is described. The results show that through selective dicing with the aid of the proposed non-destructive test, it is possible to produce large-area (say, 20×15 mm or larger) inclusion-free lead zinc niobate-lead titanate solid-solution (or PZN-PT) single crystal wafers with a narrow TC distribution (i.e. ±1.5°C), hence of consistent composition and properties, from (001) layer growth dominated flux-grown single crystals. Typical TC variations between wafers are estimated at ± 1.5°C. | |
dc.source | Scopus | |
dc.type | Conference Paper | |
dc.contributor.department | MECHANICAL ENGINEERING | |
dc.description.sourcetitle | Proceedings of the IEEE Ultrasonics Symposium | |
dc.description.volume | 2 | |
dc.description.page | 1043-1046 | |
dc.description.coden | PIEUE | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
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