Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/86043
Title: Non-destructive evaluation of compositional and property distributions in large-size relaxor single crystal wafers
Authors: Lim, L.C. 
Kumar, F.J.
Issue Date: 2001
Source: Lim, L.C.,Kumar, F.J. (2001). Non-destructive evaluation of compositional and property distributions in large-size relaxor single crystal wafers. Proceedings of the IEEE Ultrasonics Symposium 2 : 1043-1046. ScholarBank@NUS Repository.
Abstract: A multi-probe non-destructive evaluation technique for quantifying the distribution of Curie temperature of large-size relaxor single crystal wafers is described. The results show that through selective dicing with the aid of the proposed non-destructive test, it is possible to produce large-area (say, 20×15 mm or larger) inclusion-free lead zinc niobate-lead titanate solid-solution (or PZN-PT) single crystal wafers with a narrow TC distribution (i.e. ±1.5°C), hence of consistent composition and properties, from (001) layer growth dominated flux-grown single crystals. Typical TC variations between wafers are estimated at ± 1.5°C.
Source Title: Proceedings of the IEEE Ultrasonics Symposium
URI: http://scholarbank.nus.edu.sg/handle/10635/86043
ISSN: 10510117
Appears in Collections:Staff Publications

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