Please use this identifier to cite or link to this item: https://doi.org/10.1109/EPTC.2009.5416474
DC FieldValue
dc.titleFeasibility study of nanofluid cooling techniques for microelectronic systems
dc.contributor.authorZhang, H.
dc.contributor.authorTay, A.A.O.
dc.contributor.authorXue, Z.
dc.date.accessioned2014-10-07T09:14:22Z
dc.date.available2014-10-07T09:14:22Z
dc.date.issued2009
dc.identifier.citationZhang, H., Tay, A.A.O., Xue, Z. (2009). Feasibility study of nanofluid cooling techniques for microelectronic systems. Proceedings of the Electronic Packaging Technology Conference, EPTC : 619-625. ScholarBank@NUS Repository. https://doi.org/10.1109/EPTC.2009.5416474
dc.identifier.isbn9781424451005
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/85974
dc.description.abstractThere has been an increasing interest of using nanoparticle dispersed fluids, or nanofluids, for heat transfer enhancements. In this study, the feasibility of nanofluid cooling technique for microelectronic systems is examined. Three major types of nanofluids dispersed with Al2O 3, SiC and CuO of different volume fractions were prepared through a two-step process. The thermal conductivities of the nanofluid were measured based on the steady-state parallel plate method. Thermal conductivity enhancements were identified of 3-12% for SiC and CuO nanofluids and 3-8% for Al2O3 nanofluids. Moreover, the nanofluids cooling performance was tested in a liquid cooling jig for both single channel heat sink (SCHS) and micochannel heat sink (MCHS) on a thermal test die. It was found that there was almost no thermal enhancement for single channel heat sink with the Al2O3 and SiC nanofluids. On the other hand, a maximum reduction of 11% in thermal enhancement was obtained for microchannel heat sink (MCHS), at the expense of a much higher pressure drop. Clogging issues associated with the nanofluid cooling are also discussed. ©2009 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/EPTC.2009.5416474
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.doi10.1109/EPTC.2009.5416474
dc.description.sourcetitleProceedings of the Electronic Packaging Technology Conference, EPTC
dc.description.page619-625
dc.identifier.isiut000288404200109
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