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|Title:||Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM|
|Keywords:||Current sensing atomic force microscopy|
|Citation:||Gosvami, N., Lau, K.H.A., Sinha, S.K., O'Shea, S.J. (2006-03-31). Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM. Applied Surface Science 252 (11) : 3956-3960. ScholarBank@NUS Repository. https://doi.org/10.1016/j.apsusc.2005.09.050|
|Abstract:||Tuning the charge transport through a metal-molecule-metal junction by changing the interface properties is widely studied and is of paramount importance for applications in molecular electronic devices. We used current sensing atomic force microscopy (CSAFM) as a tool to study the contact resistance of metal-molecule-metal (MmM) junctions formed by sandwiching self-assembled monolayers (SAMs) of alkanethiols with various end groups (-CH3, -OH and -NH2) between Au(1 1 1) substrates and Au coated AFM tips. The effect of interface chemistry on charge transport through such SAMs with varying end groups was studied in an inert, non-polar liquid (hexadecane) environment. We find that the contact resistances of these MmM junctions vary significantly based on the end group chemistry of the molecules. © 2005 Elsevier B.V. All rights reserved.|
|Source Title:||Applied Surface Science|
|Appears in Collections:||Staff Publications|
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