Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/85904
Title: Comprehensive hygro-thermo-mechanical modeling and testing of stacked die BGA module with molded underfill
Authors: Zhang, X.
Tee, T.Y.
Ng, H.S.
Teysseyre, J.
Loo, S.
Mhaisalkar, S.
Ng, F.K.
Lim, C.T. 
Du, X.
Bool, E.
Zhu, W.
Chew, S.
Issue Date: 2005
Source: Zhang, X.,Tee, T.Y.,Ng, H.S.,Teysseyre, J.,Loo, S.,Mhaisalkar, S.,Ng, F.K.,Lim, C.T.,Du, X.,Bool, E.,Zhu, W.,Chew, S. (2005). Comprehensive hygro-thermo-mechanical modeling and testing of stacked die BGA module with molded underfill. Proceedings - Electronic Components and Technology Conference 1 : 196-200. ScholarBank@NUS Repository.
Abstract: Package reliability is a great concern in developing new advanced packages. This paper presents some of the modeling and testing activities for the design of mixed flip-chip (FC)-wire bond (WB) stacked die BGA module with molded underfill (MUF). The success of the MUF application depends on its performance in thermal shock (TS) test and pressure cooker test (PCT). Mechanical properties (modulus and adhesion strength) of MUF after post mold cure (PMC), reflow and PCT are measured. Shear strength between die and MUF under various temperature and moisture conditions are also characterized. The results show that reflow process and PCT degrade the material properties and adhesion strength. Hygro-mechanical properties, i.e. coefficient of moisture expansion (CME) and saturated moisture concentration (C sat), are also measured. Based on the measured mechanical and moisture properties, a combined hygro-mechanical and thermo-mechanical stress modeling is performed on the FC-WB stacked die BGA package to compare three types of MUF materials at various temperatures (-40°C, 25°C, 121°C and 150°C) and PCT condition. It is observed that MUF-D3 material induces the lowest stresses on the die active surface. Die stresses induced by MUF with that of conventional mold compound and underfill materials are also compared. The analysis helps in material selection of MUF to enhance the die and package reliability of BGA module. © 2005 IEEE.
Source Title: Proceedings - Electronic Components and Technology Conference
URI: http://scholarbank.nus.edu.sg/handle/10635/85904
ISSN: 05695503
Appears in Collections:Staff Publications

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