Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1631750
Title: X-ray diffraction and photoelectron spectroscopic studies of (001)-oriented Pb(Zr0.52Ti0.48)O3 thin films prepared by laser ablation
Authors: Zhu, T.J. 
Lu, L. 
Issue Date: 1-Jan-2004
Source: Zhu, T.J., Lu, L. (2004-01-01). X-ray diffraction and photoelectron spectroscopic studies of (001)-oriented Pb(Zr0.52Ti0.48)O3 thin films prepared by laser ablation. Journal of Applied Physics 95 (1) : 241-247. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1631750
Abstract: Pulsed laser deposition (PLD) method was used in order to fabricate (001)-oriented Pb(Zr0.52Ti0.48)O3 (PZT) thin films on LAO substrates with LaNiO3 (LNO) films as bottom electrodes because of their low resistivities and suitable lattice constants. Both LAO and LNO possess the perovskite structure and their lattice parameters were, respectively, 0.379 nm and 0.386 nm. This paper investigates the crystallographic and photoelectron spectroscope of the oriented PZT/LNO thin films grown under various oxygen pressures by the PLD method.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/85842
ISSN: 00218979
DOI: 10.1063/1.1631750
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

57
checked on Apr 3, 2018

WEB OF SCIENCETM
Citations

55
checked on Apr 3, 2018

Page view(s)

60
checked on Apr 20, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.