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|Title:||X-ray diffraction and photoelectron spectroscopic studies of (001)-oriented Pb(Zr0.52Ti0.48)O3 thin films prepared by laser ablation|
|Authors:||Zhu, T.J. |
|Citation:||Zhu, T.J., Lu, L. (2004-01-01). X-ray diffraction and photoelectron spectroscopic studies of (001)-oriented Pb(Zr0.52Ti0.48)O3 thin films prepared by laser ablation. Journal of Applied Physics 95 (1) : 241-247. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1631750|
|Abstract:||Pulsed laser deposition (PLD) method was used in order to fabricate (001)-oriented Pb(Zr0.52Ti0.48)O3 (PZT) thin films on LAO substrates with LaNiO3 (LNO) films as bottom electrodes because of their low resistivities and suitable lattice constants. Both LAO and LNO possess the perovskite structure and their lattice parameters were, respectively, 0.379 nm and 0.386 nm. This paper investigates the crystallographic and photoelectron spectroscope of the oriented PZT/LNO thin films grown under various oxygen pressures by the PLD method.|
|Source Title:||Journal of Applied Physics|
|Appears in Collections:||Staff Publications|
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