Please use this identifier to cite or link to this item:
|Title:||The dynamic response of a hot-wire anemometer: IV. Sine-wavevoltage perturbation testing for near-wall hot-wire/film probes and the presence of low-high frequency response characteristics|
|Authors:||Teo, C.J. |
Electronic perturbation testing
Fluid flow velocity
Near-wall flow perturbation
Wall shear stress
|Source:||Teo, C.J.,Khoo, B.C.,Chew, Y.T. (2001). The dynamic response of a hot-wire anemometer: IV. Sine-wavevoltage perturbation testing for near-wall hot-wire/film probes and the presence of low-high frequency response characteristics. Measurement Science and Technology 12 (1) : 37-51. ScholarBank@NUS Repository. https://doi.org/1/305|
|Abstract:||Experiments were performed using the electronic sine-wave voltage-perturbation test to systematically study the frequency responses of near-wall hot-wire probes subjected in turn to varying magnitudes of convective velocity and different effects of wall influence. In addition, quartz-substrate hot-film gauges with various thicknesses of quartz coating were also investigated. Results of the high cut-off frequency obtained using the sine-wave test (fsine) were found to be in fair agreement with those obtained using the square-wave test (fs) both for hot-wire and for hot-film sensors. The sine-wave test response curve exhibited a distinct bulging effect for the hot-film gauges. For the hot-wire sensors, a much weaker bulging effect was also observed. In contrast to fs and fsine, the low frequency response characteristic corresponding to the location of the bulging effect (fbulge) compared much more favourably with the dynamic frequency response (fD) obtained by Khoo et al and Chew et al using a known near-wall fluctuating flow field. Freymuth's theory for non-cylindrical hot-film sensors incorporating the Bellhouse-Schultz model was applied to predict the responses of the hot-film wall gauges when they were subjected to electronic sine-wave testing and dynamic perturbation testing under different parametric conditions. Although it is one-dimensional in nature, the model is capable of predicting most of the trends observed in the present study and previous works by Khoo et al (1998a) and Chew et al (1998a).|
|Source Title:||Measurement Science and Technology|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jan 14, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.