Please use this identifier to cite or link to this item: https://doi.org/10.1088/0957-0233/12/1/305
Title: The dynamic response of a hot-wire anemometer: IV. Sine-wavevoltage perturbation testing for near-wall hot-wire/film probes and the presence of low-high frequency response characteristics
Authors: Teo, C.J. 
Khoo, B.C. 
Chew, Y.T. 
Keywords: CTA
Dynamic response
Electronic perturbation testing
Fluid flow velocity
Frequency response
Hot-wire anemometer
Near-wall flow perturbation
Wall shear stress
Issue Date: 2001
Citation: Teo, C.J., Khoo, B.C., Chew, Y.T. (2001). The dynamic response of a hot-wire anemometer: IV. Sine-wavevoltage perturbation testing for near-wall hot-wire/film probes and the presence of low-high frequency response characteristics. Measurement Science and Technology 12 (1) : 37-51. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-0233/12/1/305
Abstract: Experiments were performed using the electronic sine-wave voltage-perturbation test to systematically study the frequency responses of near-wall hot-wire probes subjected in turn to varying magnitudes of convective velocity and different effects of wall influence. In addition, quartz-substrate hot-film gauges with various thicknesses of quartz coating were also investigated. Results of the high cut-off frequency obtained using the sine-wave test (fsine) were found to be in fair agreement with those obtained using the square-wave test (fs) both for hot-wire and for hot-film sensors. The sine-wave test response curve exhibited a distinct bulging effect for the hot-film gauges. For the hot-wire sensors, a much weaker bulging effect was also observed. In contrast to fs and fsine, the low frequency response characteristic corresponding to the location of the bulging effect (fbulge) compared much more favourably with the dynamic frequency response (fD) obtained by Khoo et al and Chew et al using a known near-wall fluctuating flow field. Freymuth's theory for non-cylindrical hot-film sensors incorporating the Bellhouse-Schultz model was applied to predict the responses of the hot-film wall gauges when they were subjected to electronic sine-wave testing and dynamic perturbation testing under different parametric conditions. Although it is one-dimensional in nature, the model is capable of predicting most of the trends observed in the present study and previous works by Khoo et al (1998a) and Chew et al (1998a).
Source Title: Measurement Science and Technology
URI: http://scholarbank.nus.edu.sg/handle/10635/85754
ISSN: 09570233
DOI: 10.1088/0957-0233/12/1/305
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