Please use this identifier to cite or link to this item: https://doi.org/10.1109/TUFFC.2003.1193612
Title: Nondestructive evaluation of large-area PZN-8%PT single crystal wafers for medical ultrasound imaging probe applications
Authors: Kumar, F.J.
Lim, L.-C. 
Lim, S.P. 
Lee, K.H.
Issue Date: Mar-2003
Citation: Kumar, F.J., Lim, L.-C., Lim, S.P., Lee, K.H. (2003-03). Nondestructive evaluation of large-area PZN-8%PT single crystal wafers for medical ultrasound imaging probe applications. IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control 50 (3) : 203-209. ScholarBank@NUS Repository. https://doi.org/10.1109/TUFFC.2003.1193612
Abstract: A nondestructive quality evaluation and control procedure for large-area, (001)-cut PZN-8%PT wafers is described. The crystals were grown by the flux technique engineered to promote (001) layer growth of the crystals. The wafers were sliced parallel to the (001) layer growth plane. Curie temperature (Tc) variations, measured with matching arrays of dot electrodes (of 5.0 mm in center-to-center spacing), were found to be better than ±4.0°C both within wafers and from wafer to wafer. After selective dicing to give final wafers of narrower Tc distributions (e.g., ±3.0°C or better), the wafers were coated with complete electrodes and poled at room temperature at 0.7-0.9 kV/mm. Typical overall properties of the poled wafers were: K3 T = 5,200 (±10% from wafer to wafer), tan δ < 0.01 (all wafers), and kt = 0.55 (±5%) (all percentage variations are in relative percentages). Then, the distributions of K3 S, tan δ, and kt were measured by the array dot electrode technique. The variations in K3 S (hence K3 T) and kt within individual wafers were found to be within ±10% and ±5%, respectively. The dielectric loss values, measured at 1 kHz, were consistently low, being
Source Title: IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
URI: http://scholarbank.nus.edu.sg/handle/10635/85486
ISSN: 08853010
DOI: 10.1109/TUFFC.2003.1193612
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

10
checked on Dec 5, 2018

WEB OF SCIENCETM
Citations

10
checked on Dec 5, 2018

Page view(s)

24
checked on Nov 16, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.